A2) Atom Probe Tomography for Nanostructure, Defect, and Failure Analysis
Chair(s): Tan Xipeng (NUS), Yeoh Wai Kang (A*STAR) Co-Chair(s): Hung-Wei (Homer) Yen (National Taiwan University, Taiwan) Symposium Scope/Topics Atom Probe Tomography (APT) has emerged as a transformative tool in materials science, enabling 3D compositional imaging at near-atomic resolution with part-per-million sensitivity. This symposium aims to spotlight the most recent advances and applications of APT in uncovering the nanostructure–property–performance relationship across a wide range of materials systems. The focus will be on using APT to unravel nanoscale features such as chemical short range order, solute clustering, segregation, precipitation, phase transformations, interfacial phenomena, and defect structures, all of which are central to understanding materials behavior under extreme environments, degradation, and failure. This symposium will bring together researchers and industry practitioners employing APT in conjunction with complementary characterization tools (e.g., TEM, TKD) and computational modeling (e.g., phase-field, DFT, MD) to tackle challenges in microelectronics, metallurgy, energy materials, and additive manufacturing. Special emphasis will be given to correlative studies and technique development, including cryo-APT, site-specific lift-out, in situ approaches, and machine learning-assisted analysis The session will serve as a dynamic platform for discussing critical insights into materials degradation and failure mechanisms, advancing our understanding of atomistic processes governing reliability and performance. We welcome contributions that cover fundamental studies, novel methodologies, and application-driven research, with the ultimate goal of advancing materials design and failure prevention at the nanoscale. Topics will include: Advanced applications of APT in metallurgy, semiconductors, and energy materials Solute segregation, clustering, chemical short range order, and phase transformations APT of interfaces, dislocations, grain boundaries, and other defects Cryogenic and in situ APT techniques Correlative APT-TEM/TKD studies Atomistic insights into failure mechanisms and degradation Machine learning and data mining in APT analysis Multiscale modeling and APT-informed simulations Challenges in quantification and specimen preparation Invited Speakers Simon Ringer University of Sydney Michael Moody Australian Nuclear Science and Technology Organisation Gang Sha Nanjing University of Science and Technology Taisuek Sasaki National Institute for Materials Science Sophie Primig UNSW Zengbao Jiao Hong Kong Polytechnic University Kun-Lin Lin National Applied Research Laboratories Yang Tao City University of Hong Kong Bok Seol Jae Kookmin University Atom Probe Tomography (APT) has emerged as a transformative tool in materials science, enabling 3D compositional imaging at near-atomic resolution with part-per-million sensitivity. This symposium aims to spotlight the most recent advances and applications of APT in uncovering the nanostructure–property–performance relationship across a wide range of materials systems. The focus will be on using APT to unravel nanoscale features such as chemical short range order, solute clustering, segregation, precipitation, phase transformations, interfacial phenomena, and defect structures, all of which are central to understanding materials behavior under extreme environments, degradation, and failure. This symposium will bring together researchers and industry practitioners employing APT in conjunction with complementary characterization tools (e.g., TEM, TKD) and computational modeling (e.g., phase-field, DFT, MD) to tackle challenges in microelectronics, metallurgy, energy materials, and additive manufacturing. Special emphasis will be given to correlative studies and technique development, including cryo-APT, site-specific lift-out, in situ approaches, and machine learning-assisted analysis The session will serve as a dynamic platform for discussing critical insights into materials degradation and failure mechanisms, advancing our understanding of atomistic processes governing reliability and performance. We welcome contributions that cover fundamental studies, novel methodologies, and application-driven research, with the ultimate goal of advancing materials design and failure prevention at the nanoscale. Topics will include: Advanced applications of APT in metallurgy, semiconductors, and energy materials Solute segregation, clustering, chemical short range order, and phase transformations APT of interfaces, dislocations, grain boundaries, and other defects Cryogenic and in situ APT techniques Correlative APT-TEM/TKD studies Atomistic insights into failure mechanisms and degradation Machine learning and data mining in APT analysis Multiscale modeling and APT-informed simulations Challenges in quantification and specimen preparation Simon Ringer University of Sydney Michael Moody Australian Nuclear Science and Technology Organisation Gang Sha Nanjing University of Science and Technology Taisuek Sasaki National Institute for Materials Science Sophie Primig UNSW Zengbao Jiao Hong Kong Polytechnic University Kun-Lin Lin National Applied Research Laboratories Yang Tao City University of Hong Kong Bok Seol Jae Kookmin University
A1) Nanoscale Characterisation using Electrons, X-rays, and Neutrons
Chair(s): Lam Yeng Ming (NTU) Co-Chair(s): Chris Boothroyd (NTU), Michel Bosman (NUS), Qian He (NUS), Rafal Dunin-Borkowski (Jülich Forschungszentrum/RWTH Aachen, Germany), Jiong Zhao (Hong Kong Polytechnic University, Hong Kong China) Symposium Scope/Topics Electron and X-ray excitations play a fundamental role in materials and device discovery. This symposium aims to discuss the challenges and opportunities in the characterization of nanoscale materials to obtain detailed pictures of their chemical, physical and structural properties. In 2017, the Nobel Prize in Chemistry which was awarded for high resolution cryo-TEM work on biological materials, this symposium will not be limited to hard matter topics but will also cover bio and soft materials. Besides electron and X-ray techniques using laboratory sources, synchrotron X-ray/neutron based techniques will be outlined in this symposium. We invite contributions in the use of these techniques for the study of inorganic, organic, hybrid and biological materials and devices. This meeting will cover a comprehensive range of topics relating to electron microscopy and X-ray techniques including but not limited to: In-Situ and operando methods in electron and X-ray techniques (stimuli can be in different forms such as heat, electrical biasing, mechanical, optical, etc.) Nanoscale characterization under gas and liquid environments Nanoscale characterization of energy conversion and storage materials Nanoscale characterization of catalysis Functional materials at the nanometer length scale Study of magnetic materials, including electron holography Cryogenic studies of biological and soft materials X-ray and electron tomography High resolution TEM and STEM Spectroscopic characterization inside a TEM Neutrons / X-ray synchrotron characterization of materials Focused ion beam (FIB) for microanalysis and sample preparation Microanalysis methods such as EBSD, EPMA, 3D Multimodal Microanalysis Ptychography/4D-STEM Invited Speakers Naoya Shibata Tokyo University Peng Gao Peking University Peter Nellist University of Oxford Joerg Jinschek Technical University of Denmark Claudia Weidenthaler Max-Planck Institute Hiroshi Jinnai Tohoku University Joanne Etheridge Monash University Eva Olsson Chalmers Unversity of Technology Feng (Ryan) Wang University College London Alexander Schoekel Deutsches Elektronen-Synchrotron DESY Anatoliy Senyshyn The research neutron source Heinz Maier-Leibnitz (FRM II) of Technische Universität München Jing Zhang Institute of High Energy Physics, Chinese Academy of Sciences (IHEP, CAS), University of Chinese Academy of Sciences (UCAS) Duane Loh NUS Electron and X-ray excitations play a fundamental role in materials and device discovery. This symposium aims to discuss the challenges and opportunities in the characterization of nanoscale materials to obtain detailed pictures of their chemical, physical and structural properties. In 2017, the Nobel Prize in Chemistry which was awarded for high resolution cryo-TEM work on biological materials, this symposium will not be limited to hard matter topics but will also cover bio and soft materials. Besides electron and X-ray techniques using laboratory sources, synchrotron X-ray/neutron based techniques will be outlined in this symposium. We invite contributions in the use of these techniques for the study of inorganic, organic, hybrid and biological materials and devices. This meeting will cover a comprehensive range of topics relating to electron microscopy and X-ray techniques including but not limited to: In-Situ and operando methods in electron and X-ray techniques (stimuli can be in different forms such as heat, electrical biasing, mechanical, optical, etc.) Nanoscale characterization under gas and liquid environments Nanoscale characterization of energy conversion and storage materials Nanoscale characterization of catalysis Functional materials at the nanometer length scale Study of magnetic materials, including electron holography Cryogenic studies of biological and soft materials X-ray and electron tomography High resolution TEM and STEM Spectroscopic characterization inside a TEM Neutrons / X-ray synchrotron characterization of materials Focused ion beam (FIB) for microanalysis and sample preparation Microanalysis methods such as EBSD, EPMA, 3D Multimodal Microanalysis Ptychography/4D-STEM Naoya Shibata Tokyo University Peng Gao Peking University Peter Nellist University of Oxford Joerg Jinschek Technical University of Denmark Claudia Weidenthaler Max-Planck Institute Hiroshi Jinnai Tohoku University Joanne Etheridge Monash University Eva Olsson Chalmers Unversity of Technology Feng (Ryan) Wang University College London Alexander Schoekel Deutsches Elektronen-Synchrotron DESY Anatoliy Senyshyn The research neutron source Heinz Maier-Leibnitz (FRM II) of Technische Universität München Jing Zhang Institute of High Energy Physics, Chinese Academy of Sciences (IHEP, CAS), University of Chinese Academy of Sciences (UCAS) Duane Loh NUS
