#ICMAT2027

Follow us on

Symposia & Chairs

A1) Nanoscale Characterisation using Electrons, X-rays, and Neutrons

Chair(s): Lam Yeng Ming (NTU)

Co-Chair(s): Chris Boothroyd (NTU), Michel Bosman (NUS), Qian He (NUS), Rafal Dunin-Borkowski (Jülich Forschungszentrum/RWTH Aachen, Germany), Jiong Zhao (Hong Kong Polytechnic University, Hong Kong China)

Electron and X-ray excitations play a fundamental role in materials and device discovery. This symposium aims to discuss the challenges and opportunities in the characterisation of nanoscale materials to obtain detailed pictures of their chemical, physical and structural properties. Following the 2017 Nobel Prize in Chemistry, which was awarded for high-resolution cryogenic transmission electron microscopy (Cryo-TEM) work on biological materials, this symposium will not be limited to hard matter topics but will also cover bio- and soft materials. Besides electron and X-ray techniques using laboratory sources, synchrotron X-ray/neutron-based techniques will also be outlined in this symposium. We invite contributions on the use of these techniques for the study of inorganic, organic, hybrid, and biological materials and devices.

This meeting will cover a comprehensive range of topics relating to electron microscopy and X-ray techniques, including but not limited to:

  • In situ and operando methods in electron and X-ray techniques (stimuli can be in different forms such as heat, electrical biasing, mechanical, optical, etc.)
  • Nanoscale characterisation under gas and liquid environments
  • Nanoscale characterisation of energy conversion and storage materials
  • Nanoscale characterisation of catalysis
  • Functional materials at the nanometer length scale
  • Study of magnetic materials, including electron holography
  • Cryogenic studies of biological and soft materials
  • X-ray and electron tomography
  • High resolution TEM and STEM
  • Spectroscopic characterisation inside a TEM
  • Neutrons and X-ray synchrotron characterisation of materials
  • Focused ion beam (FIB) for microanalysis and sample preparation
  • Microanalysis methods such as electron backscatter diffraction (EBSD) and electron probe microanalysis (EPMA), etc.
  • 3D multimodal microanalysis
  • Ptychography and 4D-STEM
Invited Speakers
Naoya Shibata Tokyo University Japan
Peng Gao Peking University China
Peter Nellist University of Oxford UK
Joerg Jinschek Technical University of Denmark Denmark
Claudia Weidenthaler Max-Planck Institute Germany
Hiroshi Jinnai Tohoku University Japan
Joanne Etheridge Monash University Australia
Eva Olsson Chalmers Unversity of Technology Sweden
Feng (Ryan) Wang University College London UK
Alexander Schoekel Deutsches Elektronen-Synchrotron DESY Germany
Anatoliy Senyshyn The research neutron source Heinz Maier-Leibnitz (FRM II) of Technische Universität München Germany
Jing Zhang Institute of High Energy Physics, Chinese Academy of Sciences (IHEP, CAS), University of Chinese Academy of Sciences (UCAS) China
Duane Loh NUS Singapore

CONTACT US

 

Exhibition Enquiries

Isaac Chua

Email: icmat2027exh@events-sp.com

 

Secretariat & General Enquiries
Isabel Chia

Email: icmat2027@events-sp.com

MRS-S Secretariat

Materials Research Society of Singapore


50 Nanyang Avenue Blk N4.1 #01-03
Singapore 639798

Catherine Leng

Copyright © 2026 ICMAT. All rights reserved.